A Patch-Clamp for detecting the DNA passage
A Patch-Clamp for detecting the DNA passage
- 발행기관 한국과학기술원 반도체설계교육센터
- 발행년도 2017
- 총서유형 Journal
- KCI ID ART002657187
- 본문언어 영어
초록/요약
A patch-clamp circuit of removing the offset with reduced noise was designed and checked in the condition of measuring the ionic current for detecting the passage of DNAs through nano-hole. The significant reduction of noise according to the measurement condition was observed whether the shielding cage surrounds or not, reminding the importance of the extra care for checking the level of the noise. The separation of the command voltage with high input impedance enables the maintenance of the same potential across the counter electrode and the working electrode. The noise level was measured to be around ~ nA, rather higher than the level of the measurement of the DNA passages. The tuning of the offset voltages is needed depending on the electrolyte condition, too.
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