나노메니퓰레이터를 이용한 나노선의 특성평가 : Applications of Nanomanipulator in Nanowires Sang
Applications of Nanomanipulator in Nanowires Sang
- 주제(키워드) Nanomanipulator , FIB , Device , Nanowire , Tensile test , Electrical resistance , RTA
- 발행기관 한국분말야금학회
- 발행년도 2009
- 총서유형 Journal
- UCI G704-000192.2009.16.2.006
- KCI ID ART001336906
- 본문언어 한국어
초록/요약
The combination of focused ion beam (FIB) and 4 point probe nanomanipulator could make various nano manufacturing and electrical measurements possible. In this study, we manufactured individual ZnO nanowire devices and measured those electrical properties. In addition, tensile experiments of metallic Au and Pd nanowires was performed by the same directional alignment of two nanomanipulators and a nanowire. It was confirmed from I-V curves that Ohmic contact is formed between electrodes and nanomanipulators, which is able to directly measure the elelctrical properties of a nanowire itself. In the mechanical tensile test, Au and Pd nanowires showed a totally different fracture behavior except the realignment from <110> to <002>. The deformation until the fracture was governed by twin for Au and by slip for Pd nanowires, respectively. The crystallographic relationship and fracture mechanism was discussed by TEM observations.
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