Formation of Europium-Silicate Thin Films and Their Photoluminescence Properties
Formation of Europium-Silicate Thin Films and Their Photoluminescence Properties
- 주제(키워드) Europium silicate , rf-sputtering , Rapid thermal annealing , Photoluminescence , Red emission
- 발행기관 한국물리학회
- 발행년도 2006
- 총서유형 Journal
- UCI G704-000411.2006.48.6.008
- KCI ID ART001195683
- 본문언어 영어
초록/요약
Strong photoluminescence (PL) centered at 600 nm was observed from europium-silicate thin .lms. The .lms were fabricated on Si(100) substrates by using a radio-frequency magnetron sput- tering method and subsequent rapid thermal annealing (RTA) in a nitrogen ambient. The mech- anism for the formation of the europium silicates during the annealing process was investigated by using X-ray diraction spectroscopy and Auger electron spectroscopy. The optical transitions associated with divalent europium ions are thought to be responsible for the intense red PL emitted from the europium-silicate thin .lms.f
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