Three-Dimensional Nanostructure Determination Based On Scanning Electron Nanodiffraction
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주제(키워드)
BASED
, DETERMINATION
, DIFFRACTION PATTERN INDEXING
, DIMENSIONAL
, Diffraction pattern indexing
, ELECTRON
, MICROSTRUCTURE
, Microstructure
, NANOCRYSTALLINE MATERIALS
, NANODIFFRACTION
, NANOSTRUCTURE
, Nanocrystalline materials
, SCANNING
, SCANNING ELECTRON NANOBEAM DIFFRACTION
, Scanning electron nanobeam diffraction
, TEM
, THREE
, Tem
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발행기관
UNIVERSITY OF ILLINOIS AT URBANA-CHAMPAIGN.
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발행년도
2016
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학위명
박사
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학과 및 전공
Materials Science and Engineerng
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UCI
I804:11009-000000150234
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DOI
10.23186/korea.000000150234.11009.0001045
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제출원본
PQDT10609691
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