The Microstructural Evolution of Fatigue Cracks in FCC Metals
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주제(키워드)
CRACKS
, EVOLUTION
, FATIGUE
, FATIGUE CRACK PROPAGATION
, FCC
, FOCUSED ION BEAM (FIB)
, FRACTOGRAPHY
, Fatigue
, Fatigue crack propagation
, Focused ion beam (fib)
, Fractography
, METALS
, MICROSTRUCTURAL
, MICROSTRUCTURE
, Microstructure
, TRANSMISSION ELECTRON MICROSCOPY (TEM)
, Transmission electron microscopy (tem)
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발행기관
UNIVERSITY OF ILLINOIS AT URBANA-CHAMPAIGN.
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발행년도
2016
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학위명
박사
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학과 및 전공
Materials Science and Engineering
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UCI
I804:11009-000000150221
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DOI
10.23186/korea.000000150221.11009.0001042
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제출원본
PQDT10609658
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