High Resolution X-ray Diffraction Characterization of III-Nitride Semiconductors: Bulk Crystals and Thin Films.
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주제(키워드)
AIN
, Ain
, BULK
, CHARACTERIZATION
, CRYSTALS
, DIFFRACTION
, FILMS
, GAN
, Gan
, HIGH
, III
, MDCVD
, Mdcvd
, NITRIDE
, RAY
, RESOLUTION
, SEMICONDUCTORS
, Semiconductors
, THIN
, X
, X-RAY DIFFRACTION
, X-ray diffraction
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발행기관
North Carolina State University
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발행년도
2015
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학위명
박사
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학과 및 전공
Materials Science and Engineering
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UCI
I804:11009-000000146783
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DOI
10.23186/korea.000000146783.11009.0000985
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제출원본
PQDT10110565
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