셀 레벨에서의 OPTICS 기반 특질 추출을 이용한 칩 품질 예측
- 주제(키워드) Cell Defect , Cell Level , Feature Extraction , OPTICS , Quality Prediction
- 발행기관 고려대학교 대학원
- 지도교수 백준걸
- 발행년도 2015
- 학위수여년월 2015. 2
- 학위구분 석사
- 학과 일반대학원 산업경영공학과
- 세부전공 산업시스템전공
- 원문페이지 43 p
- 실제URI http://www.dcollection.net/handler/korea/000000057265
- 본문언어 한국어
- 제출원본 000045827238
초록/요약
The semiconductor manufacturing industry is managed by a number of parameters from the FAB which is the initial step of production to package test which is the final step of production. Various methods for prediction for the quality and yield are required to reduce the production costs caused by a complicated manufacturing process. In order to increase the accuracy of quality prediction, we have to extract the significant features from the large amount of data. In this study, we propose the method for extracting feature from the cell level data of probe test process using OPTICS which is one of the density-based clustering to improve the prediction accuracy of the quality of the assembled chips that will be placed in a package test. Two features extracted by using OPTICS are used as input variables of quality prediction model because of having position information of the cell defect. The package test progress for chips classified to the correct quality grade by performing the improved prediction method is expected to bring the effect of reducing production costs.
more목차
제 1 장 서 론 1
제 2 장 OPTICS를 이용한 특질 추출 8
2.1 셀 결점(Cell Defect) 8
2.2 OPTICS 10
제 3 장 반도체 칩 품질 예측 모델 15
3.1 품질 예측 흐름도 15
3.2 데이터 전처리 17
3.3 특질 추출 19
3.4 예측 모델 20
제 4 장 실험 계획 및 결과 22
4.1 실험 데이터 22
4.2 실험 성능 평가 23
4.3 실험 결과 25
제 5 장 결론 및 추후 연구 30
[참고 문헌] 32
